Standard Processes | Description |
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Print & Fire | Circuit Fabrication |
Metalizing | Types of Metalizing |
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Layers: |
-Single-Layer | CONDUCTORS |
-Multi-Layer | Au, Pt, PtAu, PdAu, PtPdA |
-Double Sided | Ag, PtAg, PdAg, PtPdAg |
Plated-thru Vias / Hole | Connection top to bottom circuitry or to ground |
Solid-filled Vias / Hole | Connection top to bottom circuitry or to ground |
Dielectric | Protection for underlying circuitry |
Edge Plating / Printing | Connection to surface mount resistors |
Thick Film Printed Resistors | Alternative to surface mount resistors |
Overglaze | Protection for underlying circuitry |
Ceramic Standard Substrates | Surface Finish |
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91% Alumina | As Fired, Lapped, Polished |
92% Alumina | As Fired, Lapped, Polished |
96% Alumina | As Fired, Lapped, Polished |
99.6% Alumina | As Fired, Lapped, Polished |
Aluminum Nitride (Aln) | Lapped, Polished |
Beryllium Oxide (BeO) | As Fired, Lapped |
Specialty Substrates | Surface Finish |
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Ferrite | Lapped, Polished |
Glass | Lapped, Polished |
Macor | Lapped, Polished |
Quartz | Lapped, Polished |
Substrate Processing | Info |
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Laser Scribe | Single / Array |
Laser Drill | Vias / Holes |
Laser Machining | Per Specification |
Diamond Saw Cut | +/- .002″ Tolerance |
Assembly | Ceramic, PCB, other board types |
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Surface Mount (SMT): -Conductive, Non Conductive epoxy -Solder reflow -Solder lead / pin attachment | Circuit population using active & passive components |
Wire Bonding | Die attach circuit populationg-semiconductors |
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Gold ball | .001″-.003″ mil wire |
Gold wedge | .0005″-.003″ mil wire |
Aluminum wedge | .001″-.003″ mil wire |
Product Testing/Measurement | On HTI-Produced Units |
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Physical Dimensions(ceramic) | Verify conforming to customer specification |
Continuity / Netlist Connection integrity | Resistor Measurement Value verification / Data Recorded |
Metallization Adhesion | Leach resistance (verify adhesion) |
Trace Thickness & Width (conductor, etc) | Verify conforming to customer specification |
Wire Bond Qualification / Pull Testing | Bond strength |
Wire Bond Qualification / Shear Testing | Bond strength |
Burn-in | Circuit stabilization |
Performance | Design confirmation |
Environmental | Endurance verification |
Leak Testing Using Fluid | Verify Hermetic seal |
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Engineering/Support/CAD | Leading to HTI circuit fabrication |
Circuit Conversion | Convert from PCB (G10/FR4) |
Artwork Generation | For circuit pattern definition |
Advanced Processes | Ceramic-based circuits / items |
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Packaging, Potting & Encapsulation | Ceramic, Glass Fiber Filled Plastic, Diallyx Phthalate |
Ceramic Glass Sealing | Ceramic Packages |
Photo Patterned Thick Film (Etched) | Fine Line Geometries (0.0015″): -High Speed Circuits (>50GHz) -High Density Circuits -High Temperature Circuit |
Plated up thick film circuits | High Current/High Power:
-Ni, Cu, Au
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